Bringing Deep Learning Fault Localization to Industry — ICST 2026

I am delighted to have presented my first international conference paper, titled “Industrial Application of Deep Learning based Fault Localization with Mutation Features”, at the 2026 IEEE International Conference on Software Testing, Verification and Validation (ICST 2026) Industry Track.

The paper extends my Master’s thesis, sharing our experience optimizing and deploying deep learning-based fault localization techniques in industrial settings at LIG Nex1 and VPlusLab. It details the challenges we encountered during implementation and demonstrates how mutation features can improve fault localization accuracy in practice.

I am sincerely grateful to my advisor, Prof. Moonzoo Kim, and to my colleagues, especially Ahcheong Lee, for their support throughout this research journey.